I think most people know how to do numerical derivation in computer programming, (as limit --> 0; read: "as the limit approaches zero").
//example code for derivation of position over time to obtain velocity
float currPosition, prevPosition, currTime, lastTime, velocity;
while (true)
{
prevPosition = currPosition;
currPosition = getNewPosition();
lastTime = currTime;
currTime = getTimestamp();
// Numerical derivation of position over time to obtain velocity
velocity = (currPosition - prevPosition)/(currTime - lastTime);
}
// since the while loop runs at the shortest period of time, we've already
// achieved limit --> 0;
This is the basic building block for most derivation programming.
How can I do this with integrals? Do I use a for loop and add or what?
Numerical derivation and integration in code for physics, mapping, robotics, gaming, dead-reckoning, and controls
Pay attention to where I use the words "estimate" vs "measurement" below. The difference is important.
Measurements are direct readings from a sensor.
Ex: a GPS measures position (meters) directly, and a speedometer measures speed (m/s) directly.
Estimates are calculated projections you can obtain through integrating and derivating (deriving) measured values.
Ex: you can derive position measurements (m) with respect to time to obtain speed or velocity (m/s) estimates, and you can integrate speed or velocity measurements (m/s) with respect to time to obtain position or displacement (m) estimates.
Wait, aren't all "measurements" actually just "estimates" at some fundamental level?
Yeah--pretty much! But, they are not necessarily produced through derivations or integrations with respect to time, so that is a bit different.
Also note that technically, virtually nothing can truly be measured directly. All sensors get reduced down to a voltage or a current, and guess how you measure a current?--a voltage!--either as a voltage drop across a tiny resistance, or as a voltage induced through an inductive coil due to current flow. So, everything boils down to a voltage. Even devices which "measure speed directly" may be using pressure (pitot-static tube on airplane), doppler/phase shift (radar or sonar), or looking at distance over time and then outputting speed. Fluid speed, or speed with respect to fluid such as air or water, can even be measured via a hot wire anemometer by measuring the current required to keep a hot wire at a fixed temperature, or by measuring the temperature change of the hot wire at a fixed current. And how is that temperature measured? Temperature is just a thermo-electrically-generated voltage, or a voltage drop across a diode or other resistance.
As you can see, all of these "measurements" and "estimates", at the low level, are intertwined. However, if a given device has been produced, tested, and calibrated to output a given "measurement", then you can accept it as a "source of truth" for all practical purposes and call it a "measurement". Then, anything you derive from that measurement, with respect to time or some other variable, you can consider an "estimate". The irony of this is that if you calibrate your device and output derived or integrated estimates, someone else could then consider your output "estimates" as their input "measurements" in their system, in a sort of never-ending chain down the line. That's being pedantic, however. Let's just go with the simplified definitions I have above for the time being.
The following table is true, for example. Read the 2nd line, for instance, as: "If you take the derivative of a velocity measurement with respect to time, you get an acceleration estimate, and if you take its integral, you get a position estimate."
Derivatives and integrals of position
Measurement, y Derivative Integral
Estimate (dy/dt) Estimate (dy*dt)
----------------------- ----------------------- -----------------------
position [m] velocity [m/s] - [m*s]
velocity [m/s] acceleration [m/s^2] position [m]
acceleration [m/s^2] jerk [m/s^3] velocity [m/s]
jerk [m/s^3] snap [m/s^4] acceleration [m/s^2]
snap [m/s^4] crackle [m/s^5] jerk [m/s^3]
crackle [m/s^5] pop [m/s^6] snap [m/s^4]
pop [m/s^6] - [m/s^7] crackle [m/s^5]
For jerk, snap or jounce, crackle, and pop, see: https://en.wikipedia.org/wiki/Fourth,_fifth,_and_sixth_derivatives_of_position.
1. numerical derivation
Remember, derivation obtains the slope of the line, dy/dx, on an x-y plot. The general form is (y_new - y_old)/(x_new - x_old).
In order to obtain a velocity estimate from a system where you are obtaining repeated position measurements (ex: you are taking GPS readings periodically), you must numerically derivate your position measurements over time. Your y-axis is position, and your x-axis is time, so dy/dx is simply (position_new - position_old)/(time_new - time_old). A units check shows this might be meters/sec, which is indeed a unit for velocity.
In code, that would look like this, for a system where you're only measuring position in 1-dimension:
double position_new_m = getPosition(); // m = meters
double position_old_m;
// `getNanoseconds()` should return a `uint64_t timestamp in nanoseconds, for
// instance
double time_new_sec = NS_TO_SEC((double)getNanoseconds());
double time_old_sec;
while (true)
{
position_old_m = position_new_m;
position_new_m = getPosition();
time_old_sec = time_new_sec;
time_new_sec = NS_TO_SEC((double)getNanoseconds());
// Numerical derivation of position measurements over time to obtain
// velocity in meters per second (mps)
double velocity_mps =
(position_new_m - position_old_m)/(time_new_sec - time_old_sec);
}
2. numerical integration
Numerical integration obtains the area under the curve, dy*dx, on an x-y plot. One of the best ways to do this is called trapezoidal integration, where you take the average dy reading and multiply by dx. This would look like this: (y_old + y_new)/2 * (x_new - x_old).
In order to obtain a position estimate from a system where you are obtaining repeated velocity measurements (ex: you are trying to estimate distance traveled while only reading the speedometer on your car), you must numerically integrate your velocity measurements over time. Your y-axis is velocity, and your x-axis is time, so (y_old + y_new)/2 * (x_new - x_old) is simply velocity_old + velocity_new)/2 * (time_new - time_old). A units check shows this might be meters/sec * sec = meters, which is indeed a unit for distance.
In code, that would look like this. Notice that the numerical integration obtains the distance traveled over that one tiny time interval. To obtain an estimate of the total distance traveled, you must sum all of the individual estimates of distance traveled.
double velocity_new_mps = getVelocity(); // mps = meters per second
double velocity_old_mps;
// `getNanoseconds()` should return a `uint64_t timestamp in nanoseconds, for
// instance
double time_new_sec = NS_TO_SEC((double)getNanoseconds());
double time_old_sec;
// Total meters traveled
double distance_traveled_m_total = 0;
while (true)
{
velocity_old_mps = velocity_new_mps;
velocity_new_mps = getVelocity();
time_old_sec = time_new_sec;
time_new_sec = NS_TO_SEC((double)getNanoseconds());
// Numerical integration of velocity measurements over time to obtain
// a distance estimate (in meters) over this time interval
double distance_traveled_m =
(velocity_old_mps + velocity_new_mps)/2 * (time_new_sec - time_old_sec);
distance_traveled_m_total += distance_traveled_m;
}
See also: https://en.wikipedia.org/wiki/Numerical_integration.
Going further:
high-resolution timestamps
To do the above, you'll need a good way to obtain timestamps. Here are various techniques I use:
In C++, use my uint64_t nanos() function here.
If using Linux in C or C++, use my uint64_t nanos() function which uses clock_gettime() here. Even better, I have wrapped it up into a nice timinglib library for Linux, in my eRCaGuy_hello_world repo here:
timinglib.h
timinglib.c
Here is the NS_TO_SEC() macro from timing.h:
#define NS_PER_SEC (1000000000L)
/// Convert nanoseconds to seconds
#define NS_TO_SEC(ns) ((ns)/NS_PER_SEC)
If using a microcontroller, you'll need to read an incrementing periodic counter from a timer or counter register which you have configured to increment at a steady, fixed rate. Ex: on Arduino: use micros() to obtain a microsecond timestamp with 4-us resolution (by default, it can be changed). On STM32 or others, you'll need to configure your own timer/counter.
use high data sample rates
Taking data samples as fast as possible in a sample loop is a good idea, because then you can average many samples to achieve:
Reduced noise: averaging many raw samples reduces noise from the sensor.
Higher-resolution: averaging many raw samples actually adds bits of resolution in your measurement system. This is known as oversampling.
I write about it on my personal website here: ElectricRCAircraftGuy.com: Using the Arduino Uno’s built-in 10-bit to 16+-bit ADC (Analog to Digital Converter).
And Atmel/Microchip wrote about it in their white-paper here: Application Note AN8003: AVR121: Enhancing ADC resolution by oversampling.
Taking 4^n samples increases your sample resolution by n bits of resolution. For example:
4^0 = 1 sample at 10-bits resolution --> 1 10-bit sample
4^1 = 4 samples at 10-bits resolution --> 1 11-bit sample
4^2 = 16 samples at 10-bits resolution --> 1 12-bit sample
4^3 = 64 samples at 10-bits resolution --> 1 13-bit sample
4^4 = 256 samples at 10-bits resolution --> 1 14-bit sample
4^5 = 1024 samples at 10-bits resolution --> 1 15-bit sample
4^6 = 4096 samples at 10-bits resolution --> 1 16-bit sample
See:
So, sampling at high sample rates is good. You can do basic filtering on these samples.
If you process raw samples at a high rate, doing numerical derivation on high-sample-rate raw samples will end up derivating a lot of noise, which produces noisy derivative estimates. This isn't great. It's better to do the derivation on filtered samples: ex: the average of 100 or 1000 rapid samples. Doing numerical integration on high-sample-rate raw samples, however, is fine, because as Edgar Bonet says, "when integrating, the more samples you get, the better the noise averages out." This goes along with my notes above.
Just using the filtered samples for both numerical integration and numerical derivation, however, is just fine.
use reasonable control loop rates
Control loop rates should not be too fast. The higher the sample rates, the better, because you can filter them to reduce noise. The higher the control loop rate, however, not necessarily the better, because there is a sweet spot in control loop rates. If your control loop rate is too slow, the system will have a slow frequency response and won't respond to the environment fast enough, and if the control loop rate is too fast, it ends up just responding to sample noise instead of to real changes in the measured data.
Therefore, even if you have a sample rate of 1 kHz, for instance, to oversample and filter the data, control loops that fast are not needed, as the noise from readings of real sensors over very small time intervals will be too large. Use a control loop anywhere from 10 Hz ~ 100 Hz, perhaps up to 400+ Hz for simple systems with clean data. In some scenarios you can go faster, but 50 Hz is very common in control systems. The more-complicated the system and/or the more-noisy the sensor measurements, generally, the slower the control loop must be, down to about 1~10 Hz or so. Self-driving cars, for instance, which are very complicated, frequently operate at control loops of only 10 Hz.
loop timing and multi-tasking
In order to accomplish the above, independent measurement and filtering loops, and control loops, you'll need a means of performing precise and efficient loop timing and multi-tasking.
If needing to do precise, repetitive loops in Linux in C or C++, use the sleep_until_ns() function from my timinglib above. I have a demo of my sleep_until_us() function in-use in Linux to obtain repetitive loops as fast as 1 KHz to 100 kHz here.
If using bare-metal (no operating system) on a microcontroller as your compute platform, use timestamp-based cooperative multitasking to perform your control loop and other loops such as measurements loops, as required. See my detailed answer here: How to do high-resolution, timestamp-based, non-blocking, single-threaded cooperative multi-tasking.
full, numerical integration and multi-tasking example
I have an in-depth example of both numerical integration and cooperative multitasking on a bare-metal system using my CREATE_TASK_TIMER() macro in my Full coulomb counter example in code. That's a great demo to study, in my opinion.
Kalman filters
For robust measurements, you'll probably need a Kalman filter, perhaps an "unscented Kalman Filter," or UKF, because apparently they are "unscented" because they "don't stink."
See also
My answer on Physics-based controls, and control systems: the many layers of control
Related
I'm trying to figure out the amplitude of each frequency of sound captured by microphone.
Just like this example https://developer.apple.com/documentation/accelerate/visualizing_sound_as_an_audio_spectrogram
I captured sample from microphone to sample buffer, copy to a circle buffer, and then performed ForwardDCT on it, just like this:
func processData(values: [Int16]) {
vDSP.convertElements(of: values,
to: &timeDomainBuffer)
vDSP.multiply(timeDomainBuffer,
hanningWindow,
result: &timeDomainBuffer)
forwardDCT.transform(timeDomainBuffer,
result: &frequencyDomainBuffer)
vDSP.absolute(frequencyDomainBuffer,
result: &frequencyDomainBuffer)
vDSP.convert(amplitude: frequencyDomainBuffer,
toDecibels: &frequencyDomainBuffer,
zeroReference: Float(Microphone.sampleCount))
if frequencyDomainValues.count > Microphone.sampleCount {
frequencyDomainValues.removeFirst(Microphone.sampleCount)
}
frequencyDomainValues.append(contentsOf: frequencyDomainBuffer)
}
the timeDomainBuffer is the float16 Array contains samples counting sampleCount,
while the frequencyDomainBuffer is the amplitude of each frequency, frequency is denoted as it's array index with it's value expressing amplitude of this frequency.
I'm trying to get amplitude of each frequency, just like this:
for index in frequencyDomainBuffer{
let frequency = index * (AVAudioSession().sampleRate/Double(Microphone.sampleCount)/2)
}
I supposed the index of freqeuencyDomainBuffer will be linear to the actual frequency, so sampleRate divided by half of sampleCount will be correct. (sampleCount is the timeDomainBuffer length)
The result is correct when running on my iPad, but the frequency got 10% higher when on iPhone.
I'm dubious whether AVAudioSession().sampleRate can be used on iPhone?
Of course I can add a condition like if iPhone, but I'd like to know why and will it be correct on other devices I haven't tested on?
If you're seeing a consistent 10% difference, I'm betting it's actually an 8.9% difference. I haven't studied your code, but I'd look for a hard-coded 44.1kHz somewhere. The sample rate on iPhones is generally 48kHz.
Remember also that the bins are (as you suspect) proportional to the sampling rate. So at different sampling rates the center of the bins are different. Depending on the number of bins you're using, this could represent a large difference (not really an "error" since the bins are ranges, but if you assume it's precisely the center frequency, this could match your 10%).
In working on a project I came across the need to generate various waves, accurately. I thought that a simple sine wave would be the easiest to begin with, but it appears that I am mistaken. I made a simple program that generates a vector of samples and then plays those samples back so that the user hears the wave, as a test. Here is the relevant code:
vector<short> genSineWaveSample(int nsamples, float freq, float amp) {
vector<short> samples;
for(float i = 0; i <= nsamples; i++) {
samples.push_back(amp * sinx15(freq*i));
}
return samples;
}
I'm not sure what the issue with this is. I understand that there could be some issue with the vector being made of shorts, but that's what my audio framework wants, and I am inexperienced with that kind of library and so do not know what to expect.
The symptoms are as follows:
frequency not correct
ie: given freq=440, A4 is not the note played back
strange distortion
Most frequencies do not generate a clean wave. 220, 440, 880 are all clean, most others are distorted
Most frequencies are shifted upwards considerably
Can anyone give advice as to what I may be doing wrong?
Here's what I've tried so far:
Making my own sine function, for greater accuracy.
I used a 15th degree Taylor Series expansion for sin(x)
Changed the sample rate, anything from 256 to 44100, no change can be heard given the above errors, the waves are simply more distorted.
Thank you. If there is any information that can help you, I'd be obliged to provide it.
I suspect that you are passing incorrect values to your sin15x function. If you are familiar with the basics of signal processing the Nyquist frequency is the minimum frequency at which you can faithful reconstruct (or in your case construct) a sampled signal. The is defined as 2x the highest frequency component present in the signal.
What this means for your program is that you need at last 2 values per cycle of the highest frequency you want to reproduce. At 20Khz you'd need 40,000 samples per second. It looks like you are just packing a vector with values and letting the playback program sort out the timing.
We will assume you use 44.1Khz as your playback sampling frequency. This means that a snipet of code producing one second of a 1kHz wave would look like
DataStructure wave = new DataStructure(44100) // creates some data structure of 44100 in length
for(int i = 0; i < 44100; i++)
{
wave[i] = sin(2*pi * i * (frequency / 44100) + pi / 2) // sin is in radians, frequency in Hz
}
You need to divide by the frequency, not multiply. To see this, take the case of a 22,050 Hz frequency value is passed. For i = 0, you get sin(0) = 1. For i = 1, sin(3pi/2) = -1 and so on are so forth. This gives you a repeating sequence of 1, -1, 1, -1... which is the correct representation of a 22,050Hz wave sampled at 44.1Khz. This works as you go down in frequency but you get more and more samples per cycle. Interestingly though this does not make a difference. A sinewave sampled at 2 samples per cycle is just as accurately recreated as one that is sampled 1000 times per second. This doesn't take into account noise but for most purposes works well enough.
I would suggest looking into the basics of digital signal processing as it a very interesting field and very useful to understand.
Edit: This assumes all of those parameters are evaluated as floating point numbers.
Fundamentally, you're missing a piece of information. You don't specify the amount of time over which you want your samples taken. This could also be thought of as the rate at which the samples will be played by your system. Something roughly in this direction will get you closer, for now, though.
samples.push_back(amp * std::sin(M_PI / freq *i));
How can I draw an spectrum for an given audio file with Bass library?
I mean the chart similar to what Audacity generates:
I know that I can get the FFT data for given time t (when I play the audio) with:
float fft[1024];
BASS_ChannelGetData(chan, fft, BASS_DATA_FFT2048); // get the FFT data
That way I get 1024 values in array for each time t. Am I right that the values in that array are signal amplitudes (dB)? If so, how the frequency (Hz) is associated with those values? By the index?
I am an programmer, but I am not experienced with audio processing at all. So I don't know what to do, with the data I have, to plot the needed spectrum.
I am working with C++ version, but examples in other languages are just fine (I can convert them).
From the documentation, that flag will cause the FFT magnitude to be computed, and from the sounds of it, it is the linear magnitude.
dB = 10 * log10(intensity);
dB = 20 * log10(pressure);
(I'm not sure whether audio file samples are a measurement of intensity or pressure. What's a microphone output linearly related to?)
Also, it indicates the length of the input and the length of the FFT match, but half the FFT (corresponding to negative frequencies) is discarded. Therefore the highest FFT frequency will be one-half the sampling frequency. This occurs at N/2. The docs actually say
For example, with a 2048 sample FFT, there will be 1024 floating-point values returned. If the BASS_DATA_FIXED flag is used, then the FFT values will be in 8.24 fixed-point form rather than floating-point. Each value, or "bin", ranges from 0 to 1 (can actually go higher if the sample data is floating-point and not clipped). The 1st bin contains the DC component, the 2nd contains the amplitude at 1/2048 of the channel's sample rate, followed by the amplitude at 2/2048, 3/2048, etc.
That seems pretty clear.
How can I measure this area in C++?
(update: I posted the solution and code as an answer rather than edit the question again)
The ideal line (dashed red) is the plot from starting point with the average rise added with each angle of measurement; this I obtain via average. I measured the test data in black. How can I quantify the area of the dip in blue? X-axis is unitized, so slopes and math are simplified.
I could determine a cutoff for the size of areas like this and then flag this part for retesting or failure. Rarely, there is another dip that appears closer to the right, but setting a cutoff value for standard deviation usually fails those parts.
Update
Diego's answer helped me visualize this. Now that I can see what I'm trying to do, I'll work on the algorithm to implement the "homemade dip detector". :)
Why?
I created a test bench to test throttle position sensors I'm selling. I'm trying to programatically quantify how straight the plot is by analyzing the data collected. This one particular model is vexing me.
Sample plot of a part I prefer not to sell:
The X axis are evenly spaced angles of throttle opening. The stepper motor turns the input shaft, stopping every 0.75° to measure the output on a 10 bit ADC, which gets translated to the Y axis. The plot is the translation of data[idx] to idx,value mapped to (x,y) bitmap coordinates. Then I draw lines between the points within the bitmap using Bresenham's algorithm.
My other TPS products produce amazingly linear output.
The lower (left) portion of the plot is crucial to normal usage of any motor vehicle; it's when you're driving around town, entering parking lots, etc. This particular part has a tendency to develop a dip around 15° opening and I wish to use the program to quantify this "dip" in the curve and rely less upon the tester's intuition. In the above example, the plot dips but doesn't return to what an ideal line might be.
Even though this is an embedded application, printing the report takes 10 seconds, thus I do not consider stepping through an array of 120 points of data multiple times a waste of cycles. Also, since I'm using a uC32 PIC32 microcontroller, there's plenty of memory, so I have the luxury of being able to ponder this problem within the controller.
What I'm trying already
Array of rise between test points: I dismiss the X-axis entirely, considering it unitized, and then make an array of change from one reading to the next. This array is what contributes to the report's "Min rise between points: 0 Max: 14". I call this array deltas.
I've tried using standard deviation on deltas, however, during testing I have found that a low Std Dev is not a reliable measure for this part. If the dip quickly returns to the original line implied by early data points, the Std Dev can be deceptively low (observed to be as low as 2.3) but the part is still something I wouldn't want to use. I tried setting a cutoff at 2.6, but it failed too many parts with great plots. The other, more linear part linked to above can reliably count on Std Dev for quality.
Kurtosis seems not to apply for this situation at all. I learned of Kurtosis today and found a Statistics Library which includes Kurtosis and Skewness. During continued testing, I found that of these two measures, there was not a trend of positive, negative, or amplitude which would correspond to either passing or failing. That same gentleman has shared a linear regression library, but I believe Lin Reg is unrelated to my situation, as I am comfortable with the assumption of the AVG of deltas being my ideal line. Linear Regression and R^2 are more for finding a line from less ideal data or much larger sets.
Comparing each delta to AVG and Std Dev I set up a monitor to check each delta against final average of the deltas's data. Here, too, I couldn't find a reliable metric. Too many good parts would not pass a test restricting any delta to within 2x Std Dev away from the Average. Ultimately, the only variation from AVG I could settle on is to be within AVG+Std Dev difference from the AVG itself. Anything more restrictive would fail otherwise good parts. And the elusive dip around 15° opening can sneak through this test.
Homemade dip detector When feeding deltas to the serial monitor of the computer, I observed consecutive negative deltas during the dip, so I programmed in a dip detector, but it feels very crude to me. If there are 5 or more negative deltas in a row, I sum them. I have seen that if I take that sum the dip's differences from AVG then divide by the number of negative deltas, a value over 2.9 or 3 could mean a fail. I have observed dips lasting from 6 to 15 deltas. Readily observable dips would have their differences from AVG sum up to -35.
Trending accumulated variation from the AVG The above made me think watching the summation of deltas as it wanders away from AVG could be the answer. Meaning, I step through the array and sum the differences of each delta from AVG. I thought I was on to something until a good part blew this theory. I was seeing a trend of the fewer times the running sum varied from AVG by less than 2x AVG, the more straight the line appeared. Many ideal parts would only show 8 or less delta points where the sumOfDiffs would stray from the AVG very far.
float sumOfDiffs=0.0;
for( int idx=0; idx<stop; idx++ ){
float spread = deltas[idx] - line->AdcAvgRise;
sumOfDiffs = sumOfDiffs + spread;
...
testVal = 2*line->AdcAvgRise;
if( sumOfDiffs > testVal || sumOfDiffs < -testVal ){
flag = 'S';
}
...
}
And then a part with a fantastic linear plot came through with 58 data points where sumOfDiffs was more than twice the AVG! I find this amazing, as at the end of the ~120 data points, sumOfDiffs value is -0.000057.
During testing, the final sumOfDiffs result would often register as 0.000000 and only on exceptionally bad parts would it be greater than .000100. I found this quite surprising, actually: how a "bad part" can have accumulated great accuracy.
Sample output from monitoring sumOfDiffs This below output shows a dip happening. The test watches as the running sumOfDiffs is more than 2x the AVG away from the AVG for the whole test. This dip lasts from deltas idx of 23 through 49; starts at 17.25° and lasts for 19.5°.
Avg rise: 6.75 Std dev: 2.577
idx: delta diff from avg sumOfDiffs Flag
23: 5 -1.75 -14.05 S
24: 6 -0.75 -14.80 S
25: 7 0.25 -14.55 S
26: 5 -1.75 -16.30 S
27: 3 -3.75 -20.06 S
28: 3 -3.75 -23.81 S
29: 7 0.25 -23.56 S
30: 4 -2.75 -26.31 S
31: 2 -4.75 -31.06 S
32: 8 1.25 -29.82 S
33: 6 -0.75 -30.57 S
34: 9 2.25 -28.32 S
35: 8 1.25 -27.07 S
36: 5 -1.75 -28.82 S
37: 15 8.25 -20.58 S
38: 7 0.25 -20.33 S
39: 5 -1.75 -22.08 S
40: 9 2.25 -19.83 S
41: 10 3.25 -16.58 S
42: 9 2.25 -14.34 S
43: 3 -3.75 -18.09 S
44: 6 -0.75 -18.84 S
45: 11 4.25 -14.59 S
47: 3 -3.75 -16.10 S
48: 8 1.25 -14.85 S
49: 8 1.25 -13.60 S
Final Sum of diffs: 0.000030
RunningStats analysis:
NumDataValues= 125
Mean= 6.752
StandardDeviation= 2.577
Skewness= 0.251
Kurtosis= -0.277
Sobering note about quality: what started me on this journey was learning how major automotive OEM suppliers consider a 4 point test to be the standard measure for these parts. My first test bench used an Arduino with 8k of RAM, didn't have a TFT display nor a printer, and a mechanical resolution of only 3°! Back then I simply tested deltas being within arbitrary total bounds and choosing a limit of how big any single delta could be. My 120+ point test feels high class compared to that 30 point test from before, but that test had no idea about these dips.
Premises
the mean of a set of data has the mathematical property that the sum of the deviations from the mean is 0.
this explains why both bad and good datasets alwais give almost 0.
basically the result when differs from zero is essentially an accumulations of rounding errors in the diffs and that's why unfortunately cannot hold useful informations
the thing that most clearly define what you're looking for is your image: you're looking for an AREA and this is why you're not finding the solution in this ways:
looking to a metric in the single points is too local to extract that information
looking to global accumulations or parameters (global standard deviation) is too global and you lose the data among too much information and source of variations
kurtosis (you've already told I know but is for completeness) is out of its field of applications since this is not a probability distribution
in the end the more suitable approach of your already tryied ones is the "Homemade dip detector" because thinks in a way that is local but not too much.
Last but not least:
Any Algorithm you're going to choose has its tacit points on which it stands.
So maybe one is looking for a super clever algorithm that with no parametrization and tuning automatically adapts to the problem and self define thereshods and other.
On the other side there is an algorithm that will stand on the knowledge by the writer of the tipical data behavior (good and bad) and that is itself stupid in the way that if there is another different and unespected behavior the results are unpredictable
Ok, the right way is one of this two or is in-between them depending on the application. So if it works also the "Homemade dip detectors" can be a solution. There is not reason to define it crude but it could be that is not sufficient based on applicaton needs and that's an other thing.
How to find the area
Once you have the data the first thing is to clearly define the "theoretical straight line". I give some options:
use RANSAC algorithm (formally the best option IMHO)
this give you the best fit to the aligned points disregarding the not aligned ones
it is quite difficult and maybe oversized for this work (IMHO)
consider the line defined by the first and last point
you told that the dip is almost always in the same position that is not near boundaries so first and last points can be thought as affordable
very easy to implement
this is an example of using the knowledge about expected behaviors as I told before so you need to think if and how much confidence you give to this assumption
consider a linear fit to the first 10 points and last 10 points
is only a more affordable version of previous since using more points you can be less worried that maybe just the first point or the last were affected by any measure problem and so all fails because of this
also quite easy to implement
if I were you I will use this or something inspired to this
calculate the Y value given by the straight line for each X
calculate the area between the two curves (or the areas under the function Y_dev = Y_data - Y_straight that is mathematically the same) with this procedure:
PositiveMax = 0; NegativeMax = 0;
start from first point (value can be positive or negative) and put in a temporary area accumulator tmp_Area
for each next point
if the sign is the same then accumulate the value
if it is different
stop accumulating
check if the accumulated value is the greater than PositiveMax or below NegativeMax and if it is than store as new PositiveMax or NegativeMax
in any case reset the accumulator with tmp_Area = Y_dev; to the current value starting this way a new accumulation
in the end you will have the values of the maximum overvalued contiguous area and maximum undervalued contiguous area that I think are the scores you're looking for.
if you want you can only manage the NegativeMax based on observed and expected data behaviors
you may find useful to put a thereshold so that if a value Y_dev is lower than the thereshold you do not accumulate it.
this in order to not obtain large accumulations from many points close to the straight line that can be similar to the accumulations of few points far from the line
the need of this and and the proper thereshold needs to be evaluated on some sample data
you need to find an appropriate thereshold for this contiguous area and you can have it only from observation of sample data.
again: it can be you observing and deciding the thereshold or you can build a repository of good and bad samples and write a program that automatically learn which thereshold to use. But his is not the algorithm, this is how to find its operative parameters and there is nothing wrong to do by human brain.. ..it only depends if we're looking for a method to separate bad and good things or if we're looking for and autoadaptive algorithm that does this.. ..you decide the target.
It turns out the result of my gut feeling and Diego's method is an average of the integral. I still don't like that name, so I have described the algorithm and have asked on Math.SE what to call this, which got migrated to "Cross Validated", Stats.SE .
I Updated graphs after a massive edit of my Math.SE question. It turns out I'm taking the average of a closed integral of the derivative of the data. :P First, we gather the data:
Next is the "derivative": step through the original data array to form the deltas array which is the rise of ADC values from one 0.75° step to the next. "Rise" or "slope" is what the derivative is: dy/dx.
With the "slope" or average leveled out, I can find multiple negative deltas in a row, sum them, then divide by the count at the end of the dip. The sum is an integral of the area between average and the deltas and when the dip goes back positive, I can divide the sum by the count of the dips.
During testing, I came up with a cutoff value for this average of the integral at 2.6. That was a great measure of my "gut instinct" looking at the plot thinking a part was good or bad.
In case someone else finds themselves trying to quantify this, here's the code I implemented. Note that it is only looking for negative dips. Also, dipCountLimit is defined elsewhere as 5. In addition to the dip detector/accumulator (ie Numerical Integrator) I also have a spike detector that arbitrarily flags the test as bad if any data points stray from the average by the amount of average + standard deviation. AVG+STD DEV as a spike limit was chosen arbitrarily based on the observed plots of the parts it would fail.
int dipdx=0;
// inDipFlag also counts the length of this dip
int inDipFlag=0;
float dips[140] = { 0.0 };
for( int idx=0; idx<stop; idx++ ){
const float diffFromAvg = deltas[idx] - line->AdcAvgRise;
// state machine to monitor dips
const int _stop = stop-1;
if( diffFromAvg < 0 && idx < _stop ) {
// check NEXT data point for negative diff & set dipFlag to put state in dip
const float nextDiff = deltas[idx+1] - line->AdcAvgRise;
if( nextDiff < 0 && inDipFlag == 0 )
inDipFlag = 1;
// already IN a dip, and next diff is negative
if( nextDiff < 0 && inDipFlag > 0 ) {
inDipFlag++;
}
// accumulate this dip
dips[dipdx]+= diffFromAvg;
// next data point ends this dip and we advance dipdx to next dip
if( inDipFlag > 0 && nextDiff > 0 ) {
if( inDipFlag < dipCountLimit ){
// reset the accumulator, do not advance dipdx to next entry
dips[dipdx]=0.0;
} else {
// change this entry's value from dip sum to its ratio
dips[dipdx] = -dips[dipdx]/inDipFlag;
// advance dipdx to next entry
dipdx++;
}
// Next diff isn't negative, so the dip is done
inDipFlag = 0;
}
}
}
I am currently taking a class in school and I have to code FIR/IIR filter in C/C++.
As an input to the filter, 2kHz sine wave with white noise is used. Then, by inputting the sine wave to the C/C++ code, I need to observe the clean sine wave output. It's all done in software level.
My problem is that I don't know how to deal with this input/output of sine wave. For example, I don't know what type of file format I can use or need to use, I don't know how to make the sine wave form and etc.
This might be a very trivial question, but I have no clue where to begin.
Does anyone have any experience in this type of question or have any tips?
Any help would be really appreciated.
Generating the sine wave at 2kHz means that you want to generate values over time that, when graphed, follow a sine wave. Pick an amplitude (you didn't mention one), and pick your sample rate. See the graph here (http://en.wikipedia.org/wiki/Sine_wave); you want values that when plotted follow the sine wave graphed in 2D with the X axis being time, and the Y axis being the amplitude of the value you are measuring.
amplitude (volts, degrees, pascals, milliamps, etc)
frequency (2kHz, that is 2000 sine waves/second)
sample rate (how many samples do you want per second)
Suppose you generate a file that has a time value and an amplitude measurement, which you would want to scale to your amplitude (more on this later). So a device might give an 8-bit or 16-bit digital reading which represents either an absolute, or logarithmic measurement against some scale.
struct sample
{
long usec; //microseconds (1/1,000,000 second)
short value; //many devices give a value between 0 and 255
}
Suppose you generate exactly 2000 samples/second. If you were actually measuring an external value, you would get the same value every time (see that?), which when graphed would look like a straight line.
So you want a sample rate higher than the frequency. Suppose you sample as 2x the frequency. Then you would see points 180deg off on the sine wave, which might be peaks, up or down slope, or where sine wave crosses zero. A sample rate 4x the frequency would show a sawtooth pattern. And as you increase the number of samples, your graph looks closer to the actual sine wave. This is similar to the pixelization you see in 8-bit game sprites.
How many samples for any given sine wave would you think would give you a good approximation of a sine wave? 8? 16? 100? 500? Suppose you sampled 1,000,000 times per second, then you would have 1,000,000/2,000 = 500 samples per sine wave.
pick your sample rate (500)
define your frequency (2000)
decide how long to record your samples (5 seconds?)
define your amplitude (device measures 0-255, but what is measured max?)
Here is code to generate some samples,
#define MAXJITTER (10)
#define MAXNOISE (20)
int
generate_samples( long duration, //duration in microseconds
int amplitude, //scaled peak measurement from device
int frequency, //Hz > 0
int samplerate ) //how many samples/second > 0
{
long ts; //timestamp in microseconds, usec
long sdelay; //sample delay in usec
if(frequency<1) frequency1=1; //avoid division by zero
if(samplerate<1) samplerate=1; //avoid division by zero
sdelay = 1000000/samplerate; //usec delay between each sample
sample m;
int jitter, noise; //introduce noise here
for( long ts=0; ts<duration; ts+=sdelay ) // //in usec (microseconds)
{
//jitter, sample not exactly sdelay
jitter = drand48()*MAXJITTER - (MAXJITTER/2); // +/-1/2 MAXJITTER
//noise is mismeasurement
noise = drand48()*MAXNOISE - (MAXNOISE/2); // +/-1/2 MAXNOISE
m.usec = ts + jitter;
//2PI in a full sine wave
float period = 2*PI * (ts*1.0/frequency);
m.value = sin( period );
//write m to file or save me to array/vector
}
return 0; //return number of samples, or sample array, etc
}
First generate some samples,
generate_samples( 5*1000000, 100, 2000, 2000*50 );
You could graph the samples generated as a view of the noisy signal.
The above certainly answers many of your questions about how to record measurements, and what format is typically used. And it shows how transit through the period of multiple sine waves, generate random samples with jitter and noise, and record samples over some time duration.
Building your filter is a second issue. Writing the code to emulate the filter(s) described below is left as an exercise, or a second question as you glean more understanding,
http://en.wikipedia.org/wiki/Finite_impulse_response
http://en.wikipedia.org/wiki/Infinite_impulse_response
The generated sample of the signal (above) would be fed into the code you write to build the filter. Expect that the output of the filter would be a new set of samples, perhaps with jitter, but expect that your filter would eliminate at least some of the noise. You would then be able to graph the samples produced by the filter.
You might consider that converting the samples into a comma delimited file would enable you to load them into excel and graph them. And it might help if you elucidated your electronics background, your trig knowledge, and how much you know about filters, etc.
Good luck!